1. Imtiaz Ahamed Apon, M. D. Ratul Hasan, Istiak Ahmed Ovi, Fatema-Tuz- Zahra, "
Pressure-driven semiconducting to metallic transition in francium tin trihalides perovskite with improved optoelectronic performance: A DFT study,"
AIP Advances, AIP Publishing, vol. 14, no: 6, 2024, doi: https://doi.org/10.1063/5.0207336
International Journal
2. M. D. Ratul Hasan, Imtiaz Ahamed Apon, Istiak Ahmed Ovi, Fatema-Tuz -Zahra, "
Impact of Applied Pressure on Tin-Based Cubic Halide Perovskite ASnX3 (A = Li, Na and X = Cl, Br, and I) in Reference to Their Optoelectronic Applications,"
International Journal of Energy Research, Wiley, vol. 2024, 2024, doi: https://doi.org/10.1155/2024/8213804
International Journal
3. Fatema-Tuz- Zahra,Md Mehidi Hasan,Md. Bokhtiar Hossen,Md. Rasidul Islam, "
,"
Heliyon, Elsevier BV, 2024, doi: https://doi.org/10.1016/j.heliyon.2024.e33096
International Journal
4. Md. Tanvir Hossain,Fatema-Tuz- Zahra,Md. Mehidi Hasan,Samuchsash Swargo,Reaz Al-Arefeen Dhroobo,Md. Robbel Al Amin,F.M.A. Sieam,Srijani Talukder Disha,Md. Rasidul Islam, "
,"
Materials Science in Semiconductor Processing, Elsevier BV, 2024, doi: https://doi.org/10.1016/j.mssp.2024.108694
International Journal
5. Fatema-Tuz -Zahra,Md. Mafidul Islam,Md. Mehidi Hasan,Md. Rasidul Islam,Sohail Ahmad, "
,"
Journal of Physics and Chemistry of Solids, Elsevier BV, 2024, doi: https://doi.org/10.1016/j.jpcs.2024.112037
International Journal
6. Md. Tanvir Hossain,Md Mehidi Hasan,Fatema-Tuz Zahra,Samuchsash Swargo,Reaz Al-Arefeen Dhroobo,Md. Robbel Al Amin,F.M.A. Sieam,Srijani Talukder Disha,Md. Rasidul Islam, "
,"
Physica B: Condensed Matter, Elsevier BV, 2024, doi: https://doi.org/10.1016/j.physb.2024.416131
International Journal
1. Fatema-Tuz-Zahra; Md. Bokhtiar Hossen, "
Investigation of the Optoelectronic Characteristics of Lead-free SrGaF3 Perovskite in the Context of Density Functional Theory,"
2024 3rd International Conference on Advancement in 911±¬ÁÏ and Electronic Engineering (ICAEEE), Gazipur, 911±¬ÁÏ, IEEE, 2024, doi: https://doi.org/10.1109/ICAEEE62219.2024.10561819
International Conference